Imaging thermal properties of thermal interface materials using frequency-domain thermoreflectance microscopy
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Imaging thermal properties at the microscale is crucial for unveiling the structure-property relation and developing next-generation thermal management materials. Here, we apply a frequency-domain thermoreflectance (FDTR) microscopy for imaging the ...
MoreImaging thermal properties at the microscale is crucial for unveiling the structure-property relation and developing next-generation thermal management materials. Here, we apply a frequency-domain thermoreflectance (FDTR) microscopy for imaging the thermal conductivity and interfacial thermal conductance of thermal interface materials (TIMs). A fixture customized for imaging thermal properties of TIMs is developed, where the sample is sandwiched between a silica slide coated with a metal transducer and a substrate wafer, and the thermal transport properties are extracted using a bidirectional thermal model. The thermal conductivity of TIMs loaded with thermally conductive particles is profiled with micrometer resolution, and significant local non-uniformity is observed. Pressure-dependent FDTR imaging during loading and unloading reveals the local redistribution of conductive filler particles. Correlative micro-computed tomography reveals that the high thermal conductivity regions correspond to the aggregation of thermally conductive particles. Further statistical analysis of the FDTR image unveiled the asymmetrical and long-tailed probabilistic distribution of thermal conductivity values. Through statistical modeling, we demonstrate that this asymmetry originates from the lognormal size distribution of microparticles. Our work sheds light on the structure-property relation between microstructure and thermal conductivity distribution of TIMs at the microscale.
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Yuhan Yao, ... Xin Qian
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DOI: https://doi.org/10.70401/tx.2026.0020 - June 02, 2026


















